EDA Tech Forum Journal—the premier EDA publication

EDA Tech Forum journal is a quarterly publication for the Electronics Design Automation community including design engineers, engineering managers, industry executives, and academia. EDA Tech Forum journal provides an ongoing medium in which to discuss, debate, and communicate the electronic design automation industry’s most pressing issues, challenges, methodologies, problem-solving techniques, and trends.

December, 2005

<Tech Forum>

ESL/System C

Behavioral IP reuse methodology

Sean Dart of Forte Design Systems outlines a more efficient alternative to RTL-led approaches to the reuse of intellectual property.

Verified RTL to gates

Analog verification IP and the next stage in the evolution of system-on-chip

Sandipan Bhanot of Knowlent considers the move to automate AMS IP verification.

Digital/Analog Implementation

Which ADC architecture is right for your application

Walt Kester of Analog Devices begins a review of the benefits of the most popular architectures for the main ADC application spaces.

Design to Silicon

Applying some perspective to DFM

Michael Smayling of Applied Materials provides a fab equipment supplier’s perspective on how to make design-for-manufacture really work.

Design to Silicon

Meeting yield enhancement challenges

Greg Aldrich of Mentor Graphics outlines a yield-friendly diagnostic flow for the more detailed analysis of manufacturing defects.

Tested component to system

Effects of InfiniBand fixture crosstalk on a synthesized eye diagram

Eugene Mayevskiy of Tektronix describes the correct data acquisition process to de-embed fixture crosstalk from synthesized eye diagram measurements.

Best of DAC 2005

A new canonical form for fast Boolean matching in logic synthesis and verification

EDA Tech Forum publishes the second of the two ‘best of’ papers from the 2005 Design Automation Conference. The contributors this quarter are Afshin Abdollahi and Massoud Pedram from the University of Southern California.

<Commentary>

Provocative thinking

Start here

The industry needs more of it to cope with the changes now under way.

Market analysis

DFM will change the industry's business models

Bob Johnson, Nancy Wu, and Gary Smith of Gartner Dataquest take a cool, hard look at the commercial implications of a ‘hot button’ issue.

IEEE/EDA

Taking a broad view

Al Dunlop, launch president of the IEEE’s new Council on EDA, talks about its aims and objectives.

Encryption

IP protection under OASIS

The successor to GDSII enables more efficient encryption, explains Thomas J.Grebinski of Oasis Tooling.

 
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