EDA Tech Forum Journal—the premier EDA publicationEDA Tech Forum journal is a quarterly publication for the Electronics Design Automation community including design engineers, engineering managers, industry executives, and academia. EDA Tech Forum journal provides an ongoing medium in which to discuss, debate, and communicate the electronic design automation industry’s most pressing issues, challenges, methodologies, problem-solving techniques, and trends. |
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The verification, test and debug of SystemC models can be undertaken at an early stage in the design process. To support these techniques, the SystemC Verification Library uses a concept called data introspection. It lets a library routine extract information from SystemC compound types, or a user-specified composite that is derived from a SystemC type. Unfortunately, data introspection has some limitations, especially when the number of language features applied is on the increase. For example, native C++ data types will not appear in metadata extracted by introspection. This paper describes a non-intrusive analysis technique that aims to overcome the drawbacks with existing data introspection. It is a hybrid technique based on joining a parser that collects static information with a code generator that evaluates run-time information. To view the rest of the article, login or register below Existing users:New users, register to access all online articles and archives:To register for access to online articles and archives, simply fill out the fields below. Fields marked with
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