Silicon test moves up the food chain (intro)

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Home > Journal > December, 2009

Silicon test moves up the food chain

Technological advances are often driven by the need to simplify and control a task. Silicon test is a good example. Its requirements are continuously increasing in complexity and this process drives the development and adoption of automated test strategies.

A thorough approach to manufacturing test is essential to the delivery of high-quality devices. A whole-chip test methodology must address logic, memory, clock generation and I/O access. You need to vary the test types and their application methods used, and also fully analyze early silicon and yield-limiting defects. These various and increasingly complex requirements make automation necessary.

This article discusses the move to automated tools to support the test methods, flexibility and defect analysis necessary in today’s mixed-signal system-on-chip production environment.

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