EDA Tech Forum Journal—the premier EDA publication

EDA Tech Forum journal is a quarterly publication for the Electronics Design Automation community including design engineers, engineering managers, industry executives, and academia. EDA Tech Forum journal provides an ongoing medium in which to discuss, debate, and communicate the electronic design automation industry’s most pressing issues, challenges, methodologies, problem-solving techniques, and trends.

EDA Tech Forum, March, 2007

<Tech Forum>

ESL/SystemC

Electronic system level design for embedded systems

Electronic system level design for embedded systems

Jeff Roane of VaST Systems Technology addresses how best to model processors and exploit software virtual prototypes as embedded software plays an ever greater role.

ESL/SystemC

System-level design matures

System-level design matures

Chris Lennard & Seth Bernsen of ARM and Jeremy Bennett of Tenison Design Automation chart the progress made in bringing ESL to fruition for commercial chip development.

Verified RTL to gates

Revealing the hidden cost of performance for physical verification

Revealing the hidden cost of performance for physical verification

John Ferguson of Mentor Graphics identifies the critical dollar factors often overlooked during a cost-benefit analysis of tools for this slice of the design flow.

Digital/analog implementation

Automating design for high volume consumer markets

Automating design for high volume consumer markets

Kevin Steptoe of Pulsic describes a 'custom design automation' strategy that overcomes the problems ASIC-focused tools pose on silicon that undergoes multiple ECOs to enhance yield.

Design to silicon

Scan infrastructure and environment for enhanced at-speed ATPG

Scan infrastructure and environment for enhanced at-speed ATPG

Stephen Pateras of LogicVision proposes a new methodology that aims to overcome the limitations of traditional and sequential ATPG for deep submicron designs.

Design to silicon

Confronting chip assembly challenges

Confronting chip assembly challenges

Sudhakar Jilla of Sierra Design Automation sets out a new approach to addressing the impact of variation on assembly and avoiding late re-spins.

Tested component to system

Re-evaluating the flow for package-aware chip design

Re-evaluating the flow for package-aware chip design

Joel McGrath of Rio Design Automation explores the need for a more holistic and earlier focus on packaging in the era of SiP and other emerging integration strategies.

<Commentary>

Analysis

Start Here

Start Here

Questions and -- thankfully -- answers for 2007.

Analysis

Consumer market promises steady progress

Consumer market promises steady progress

But who is getting the benefit as the attack of ASPs continues? We review the latest CEA data.

Interview

From A to B via Z

From A to B via Z

Stanford professor and IEDM keynoter Tom Lee argues that technology has its foundations in the joy of human chaos.

The Cutting Edge

MPSoC demands system-level design automation

MPSoC demands system-level design automation

Can the multiprocessor system-on-chip take us through impending road blocks? Peter Flake and Frank Schirrmeister of Imperas act as our navigators.

Design Economics

'Build vs buy' in an SoC world

'Build vs buy' in an SoC world

Phil Casini of Sonics addresses the economic case for adopting outsourced IP at the interconnect.

Preview

Double figures for DATE

Double figures for DATE

We preview this spring’s Design Automation and Test in Europe conference in Nice, France.

 
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